TPI for improving PR fault coverage of Boolean and three-state circuits
نویسندگان
چکیده
TPI can be used to improve the pseudo-random testability of circuit. However, many TPI algorithms are based on COP, which can only cope with Boolean circuits, while in the industry also three-state circuits are found. In this paper the testability analysis method COP and the COP based HCRF TPI algorithm are extended with three-state capabilities, and the HCRF TPI algorithm is adjusted in such a way that better PR fault coverage improvements can be achieved as well as for Boolean as for three-state circuits.
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